AFM for 2DM studies in the inert environments.

The project aims to study a broad range of air-sensitive 2D materials and their heterostructures, and perform scanning probe studies of their mechanical, electronic and chemical properties tested simultaneously using a state-of-the-art scanning probe instrument. The proposed platform must include a variety of Atomic Force Microscopy (AFM) modes (cAFM, EFM, PFM, Force Curves, KpFM, friction AFM, Youngs modulus measurements, non-invasive topography, nanomanipulation and nanolithography) and allow their use in an inert gas environment, such as argon or nitrogen with