Ion Beam Mill for TEM sample preparation

Sheffield Hallam University have purchased an Ion Mill for Transmission Electron Microscope (TEM) sample preparation and 1 year warranty. The features required were low angle of incidence and variable keV suitable for preparation of TEM samples. This instrument will be used by a range of students and staff to prepare TEM samples as part of research and innovation activities, mainly within the Materials and Engineering Research Institute (MERI) but occasionally from other areas of research and innovation to which TEM is applicable.