UOR-LAB-24-14

UNIVERSITY OF READINGcontractContracts FinderRef IT-53-1850-Focused Ion Beam (FIB) Scanning Electron Microscopclosed
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Estimated value

£930k

Awarded value

Suppliers

0

Lots

1

0 awarded

Published

09 Feb 2024

Deadline 27 Feb 2024

Description

We require a field emission gun, scanning electron microscope configured with a Ga focussed ion beam, lamellae lift out, cryogenic and heated sample stages, and an energy dispersive X-ray spectroscopic capability. The system must be capable of operation as a highly specified cryo FIB-SEM as its primary role in medical and biological research but also have the capability to work on the wide range of samples indicated above in Background Information. The system should include a magnetic field cancelling system (AC and DC) if your site survey indicated that this would be necessary to meet the specified microscope performance if sited in rooms 24 or 25.

Scope

Reference
IT-53-1850-Focused Ion Beam (FIB) Scanning Electron Microscop
Total value
£930,000 excluding VAT
Commercial tool
Standalone contract
Contract dates
29 Feb 2024 to 31 Jul 2024
CPV classifications
38000000

Submission & procedure

Submission deadline
27 Feb 2024, 12:00 pm