UOR-LAB-24-14
UNIVERSITY OF READINGcontractContracts Finder ↗Ref IT-53-1850-Focused Ion Beam (FIB) Scanning Electron Microscopclosed
Estimated value
£930k
Awarded value
—
Suppliers
0
Lots
1
0 awarded
Published
09 Feb 2024
Deadline 27 Feb 2024
Description
We require a field emission gun, scanning electron microscope configured with a Ga focussed ion beam, lamellae lift out, cryogenic and heated sample stages, and an energy dispersive X-ray spectroscopic capability. The system must be capable of operation as a highly specified cryo FIB-SEM as its primary role in medical and biological research but also have the capability to work on the wide range of samples indicated above in Background Information. The system should include a magnetic field cancelling system (AC and DC) if your site survey indicated that this would be necessary to meet the specified microscope performance if sited in rooms 24 or 25.
Scope
- Reference
- IT-53-1850-Focused Ion Beam (FIB) Scanning Electron Microscop
- Total value
- £930,000 excluding VAT
- Commercial tool
- Standalone contract
- Contract dates
- 29 Feb 2024 to 31 Jul 2024
- CPV classifications
- 38000000
Submission & procedure
- Submission deadline
- 27 Feb 2024, 12:00 pm