Wide-Bandgap Dynamic Reliability & Robustness Power Characterisation Tester
Estimated value
£277k
Awarded value
—
Suppliers
0
Lots
1
Published
08 Dec 2025
Description
The University of Warwick has a requirement to purchase a Dynamic Reliability & Robustness Power Characterisation Tester designed for testing wide bandgap (SiC and GaN) power semiconductor device. In order to express interest in this opportunity please go to the University of Warwick In-Tend supplier portal (https://in-tendhost.co.uk/universityofwarwick). The University of Warwick is not a contracting authority for the purposes of the Public Contracts Regulations 2015 (as amended) or the Procurement Act 2023 and associated Procurement Regulations 2024 (and as may be amended from time to time) and its procurement activities are not subject to the requirements set out therein or the obligations under the European Public Procurement Directives, including the European Remedies Directive. Should the University advertise contracts in the Official Journal of the European Union, Find-A-Tender platform or other contract opportunity advertising site or platform, this is at the sole discretion of the University and is undertaken on a voluntary basis with no implied obligation to comply with the procurement legislation.
Scope
- Reference
- SM-12-25-ENG-EPSRC-TESTER-PG
- Total value
- £277,000 excluding VAT£332,400 including VATAbove the relevant threshold
- Commercial tool
- Standalone contract
- Contract dates
- 02 Feb 2026 to 02 Feb 2027
- Main category
- goods
- CPV classifications
- 383000003890000038000000
- Contract locations
- UK, United Kingdom
Award criteria
Criteria the buyer will use to evaluate bids.
| Name | Description | Type | Weighting |
|---|---|---|---|
| Simple description | Please refer to the ITT part 2 tender documents | price | — |
Submission & procedure
- Enquiry deadline
- 22 Dec 2025, 12:00 pm
- Submission deadline
- 07 Jan 2026, 12:00 pm
- Submission address
- https://in-tendhost.co.uk/universityofwarwick/aspx/Home ↗
- Electronic submission
- Yes
- Procedure
- Open procedure